Akrometrix AXP

Akrometrix AXP

Analytical laboratory / Thermal analysis / Thermal topography (TherMoiré)

Akrometrix AXP

Supplier :

Model :

AXP

Purpose :

Measurement of in-plane and out-of-plane strain during thermal profile with Shadow-Moiré or DIC technics

CAPABILITY:

Area of measurement of 100 mm x 100 mm

Frequency of measurement maximum of 0.2 Hz

Out-of-plane measurement minimum of 20 microns

Temperature control with PID controller

Custom thermal profile

Direct heating with infrared:

  • Interval of 22 Celsius to 250 Celsius
  • Heat rate maximum of 0.5 Celsius/second
  • Free cooling only

Convective heating and cooling:

  • Interval of -60 Celsius to 250 Celsius
  • Heat rate maximum of 0.3 Celsius/second
  • Cooling rate maximum of 0.5 Celsius/second

To obtain more information about this equipment, email us !

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