Test Research Inc – TR7680

Blog Archives

Capability: Modular metrology platform: 300X300X200mm Accuracy: 3 µm (z axis) Tech. specs: mfd 2nm/mm, sigma/step inf. 3nm 2 on-board indexed

11 February 2017

CAPABILITY: Integrated input and output elevators load and unload stacked  tray Inertially balanced for vibration free and shock free operation

11 February 2017