Teradyne Ultraflex

Teradyne Ultraflex

Electrical tests laboratory / Functionality tests / Electrical verification

Teradyne Ultraflex

Supplier :

Model :

Purpose :

Electrically verify integrated circuits

CAPABILITY:
HSD1000 cards

800 Mbps, OTA: +/- 150ps, Pattern Mem: 256MB/pin,

scan option

UP1100 cards

1600 Mbps, OTA: +/- 100ps, Pattern Mem: 496MB/pin,

scan option, Hardware Source Synchronous, Protocol

Aware Option for many high speed buses (ex: DDR),

Memory Test Option

Capability:

UltraPin400 cards

4000 Mbps, OTA: +/- 35ps, Pattern Mem: 512MB/pin, scan option

SB6G cards

6.4 Gbps, Pattern Mem: 256MB/pin, PRBS Hardware, Receive Data-Lock, Jitter Injection, Real-Time Data Eye compliance

UltraSerial10G cards

10 Gbps, Pattern Mem: 256MB/pin, PRBS Hardware, Receive Data-Lock,  Jitter Injection, Real-Time Data Eye compliance, Protocol Aware Option for many high speed buses (ex: DDR, PCIe 2.0)

UltraPac80 Mixed Signal Option

8 independent source and capture channels

source: 16/24 bit, 400 MHz, 32 Msample Mem, DC to 80MHz BW

capture: 16/24 bit, 75/30 MHz, 8 Msample Mem, DC to 75MHz BW

< 56ps channel to channel skew

Per Pin Measurement Unit & Time Measurement Unit

VHFAC Option

2 independent source and capture channels

source: 14 bit, 400 Msps, 8 Msample Mem, DC to 160MHz BW

capture: 12/14 bit, 125/80 Msps, 1 Msample Mem, DC to 62.5MHz BW

Per Pin Measurement Unit & Time Measurement Unit

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