Zeiss GeminiSEM 560 scanning electron microscope (SEM)

Zeiss GeminiSEM 560 scanning electron microscope (SEM)

Analytical laboratory / Surface analysis / Scanning electron microscope (SEM)

Zeiss GeminiSEM 560 scanning electron microscope (SEM)

Supplier :

Zeiss

Model :

GeminiSEM 560

Purpose :

Surface characterization and elemental chemical analysis

CAPABILITY:

Resolution:

  • 0.5 nm @ 15 kV
  • 0.8 nm @ 1 kV
  • 1.0 nm @ 500 V

Magnification: 1X to 2000000X

Electron gun: Schottky thermal field emission

Probe current: 3 pA to 20 nA

Acceleration voltage: 0,02 to 30 kV

Variable pressure mode (10 to 60 Pa)

 

Secondary electron Everhart-Thornley detector

In Lens secondary electron detector 

BxE Backscattered electron detector

aBSD4 Backscattered electron detector)

VPSE detector (variable pressure mode)

 

Specimen stage

X: 153 mm

Y: 153 mm

Z: 50 mm

Z’: 13 mm

Tilt: -15 to 70 degrees

Rotation: 360 degrees continuous

 

X-Rays Energy dispersive spectrometer (EDS): Oxford Ultim Max allowing elemental chemical analysis.

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