Analytical laboratory / Surface analysis / Scanning electron microscope (SEM)
Zeiss GeminiSEM 560 scanning electron microscope (SEM)
Supplier :
Zeiss
Model :
GeminiSEM 560
Purpose :
Surface characterization and elemental chemical analysis
CAPABILITY:
Resolution:
- 0.5 nm @ 15 kV
- 0.8 nm @ 1 kV
- 1.0 nm @ 500 V
Magnification: 1X to 2000000X
Electron gun: Schottky thermal field emission
Probe current: 3 pA to 20 nA
Acceleration voltage: 0,02 to 30 kV
Variable pressure mode (10 to 60 Pa)
Secondary electron Everhart-Thornley detector
In Lens secondary electron detector
BxE Backscattered electron detector
aBSD4 Backscattered electron detector)
VPSE detector (variable pressure mode)
Specimen stage
X: 153 mm
Y: 153 mm
Z: 50 mm
Z’: 13 mm
Tilt: -15 to 70 degrees
Rotation: 360 degrees continuous
X-Rays Energy dispersive spectrometer (EDS): Oxford Ultim Max allowing elemental chemical analysis.