CAPABILITY: Test every form factor modules up to 55mm x 55mm Compatible with 0.8mm and 1mm BGA/LGA pitch Fully configurable
CAPABILITY: OHMS 9 ranges: 10 Ù to 1GÙ Two-wire and four-wire Ohms with offset compensation Up to 50,000 readings/sec (5.5
CAPABILITY: High Precision Measurements of Semiconductor Devices Up to 2000 Volts or 10 Amp Sourcing Up to 220 Watts 1
CAPABILITY: N4903B-C13: Pattern generator and error detector up to 12.5Gb/s N4876A: Mutliplexer 2:1 allowing to test data rates up to
CAPABILITY: N9020A-508 Frequency range, 20 Hz to 8.4 GHz N9020A-P08 Preamplifier, 8.4 GHz N9020A-PFR Precision frequency reference N9020A-EA3 Electronic attenuator,
CAPABILITY: Analog bandwidth: 2 GHz (4 ch) Sample rate: 10 Gsa/s (2 ch), 5 Gsa/s (4 ch) Record Length: 250M
CAPABILITY: UXR0404AP Infinium UXR Real-Time Oscilloscope 4 channels, 40 GHz, 256 GSa/s, 10-bit ADC 5 GHz Configurable mmWave Extension Bandwidth
CAPABILITY: E8663D-509 Frequency range from 100 kHz to 9.0GHz E8663D-1E1 Step attenuator E8663D-UNY Enhanced ultra low phase noise
CAPABILITY: DSA8200JNB01 80E09 Sampling Module Dual Channel 60 GHz (5.8 ps step response) 80E03 Sampling Module Dual Channel 20 GHz
