Packaging assembly laboratory / Wafer Dicing / Wafer inspection (scanner)
Rudolph WS3880
Supplier :
Model :
Purpose :
Automated wafer inspection prior to dicing
CAPACITY:
Automatic slice support:
200 and 300mm
Thickness from 800µm to 190µm
Maximum number of bump / slice: 10 million
2D optical detection: 5µm
3D laser detection: 0.125µm, 4 MHz data acquisition rate
Depth of field: 28µm (2D), 200µm (3D)
Very high resolution 3D detector: 5µm
5-position lens turret: 1.25X, 2X, 5X, 10X)
Bright and dark field lighting
2D metrology and bump fault detection
3D measurement of height and coplanarity of bumps
Electronic slice mapping
Integrated ISO class 2 filtration unit
Remote computer fault review