CAPABILITY: Tescan Mira-3 High Resolution Schottky Field Emission Scanning Electron Microscope (FESEM) Column Fully integrated Orsay Physics Plasma Xe source

CAPABILITY: Laser specification oriented to removed organic material Sealed 14 Watt Diode-Pumped IR laser module for decap ,Air cooled Nanosecond

CAPABILITY: Sample up to 25 mm Ø In-Situ coating of SEM and TEM sample with various target material Surface cleaning,

CAPABILITY: Cutting Rough cutting max sample size :50  X 50 cm Precision cutting : 160 X 50 mm / 70