Tescan Feras 3XM

Blog Archives

CAPABILITY: Tescan Mira-3 High Resolution Schottky Field Emission Scanning Electron Microscope (FESEM) Column Fully integrated Orsay Physics Plasma Xe source

12 February 2017

CAPABILITY: Sample up to 25 mm Ø In-Situ coating of SEM and TEM sample with various target material Surface cleaning,

12 February 2017