CAPACITY: X-Rays source:  Filament-free transmissive Voltage: 30-160 kV Maximum power: 20 W Detail detectability: 0,1 µm (0,3 µm at 10 W and more) Inspection area (max): 510 x

Capability: Available modes: C-SCAN and DTS (Dynamic Through Scan) Designed for one transducer Scanning up to 300 mm Frequencies: 10

CAPABILITY: Electro optical terahertz pulse reflectometry Non-destructive rapid fault isolation Locating faults within the device under test Fault position accuracy

CAPABILITY: Bulk glasses, polymers, plastics, garnets and other materials (both rigid and flexible) including liquids No matching fluids required Determination

CAPABILITY: Resolution: < 0.6 um resolution: 0.5 micron feature recognition X-ray source:  Up to 150keV Field of View: 0.65mm x

CAPABILITY: Time Domain Reflectometry: 80E04 TDR Sampling Module (20Ghz) 80E10 TDR Sampling module (50GHz) Q-factor Extinction Ratio Signal-to-noise Ratio Wide